Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2005-10-04
2005-10-04
Brock, II, Paul E (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S072000
Reexamination Certificate
active
06952020
ABSTRACT:
A p channel TFT of a driving circuit has a single drain structure and its n channel TFT, a GOLD structure or an LDD structure. A pixel TFT has the LDD structure. A pixel electrode disposed in a pixel portion is connected to the pixel TFT through a hole bored in at least a protective insulation film formed of an inorganic insulating material and formed above a gate electrode of the pixel TFT, and in an interlayer insulating film disposed on the insulation film in close contact therewith. These process steps use 6 to 8 photo-masks.
REFERENCES:
patent: 5323042 (1994-06-01), Matsumoto
patent: 5424244 (1995-06-01), Zhang et al.
patent: 5508209 (1996-04-01), Zhang et al.
patent: 5563427 (1996-10-01), Yudasaka et al.
patent: 5583369 (1996-12-01), Yamazaki et al.
patent: 5608251 (1997-03-01), Konuma et al.
patent: 5620905 (1997-04-01), Konuma et al.
patent: 5623157 (1997-04-01), Miyazaki et al.
patent: 5643826 (1997-07-01), Ohtani et al.
patent: 5712495 (1998-01-01), Suzawa
patent: 5767930 (1998-06-01), Kobayashi et al.
patent: 5804878 (1998-09-01), Miyazaki et al.
patent: 5841170 (1998-11-01), Adan et al.
patent: 5849043 (1998-12-01), Zhang et al.
patent: 5856689 (1999-01-01), Suzawa
patent: 5923962 (1999-07-01), Ohtani et al.
patent: 5939731 (1999-08-01), Yamazaki et al.
patent: 5946561 (1999-08-01), Yamazaki et al.
patent: 5952708 (1999-09-01), Yamazaki
patent: 5962872 (1999-10-01), Zhang et al.
patent: 5982002 (1999-11-01), Takasu et al.
patent: 5998841 (1999-12-01), Suzawa
patent: 6031290 (2000-02-01), Miyazaki et al.
patent: 6034748 (2000-03-01), Furuta
patent: 6057897 (2000-05-01), Ichikawa et al.
patent: 6066860 (2000-05-01), Katayama et al.
patent: 6088071 (2000-07-01), Yamamoto et al.
patent: 6104040 (2000-08-01), Kawachi et al.
patent: 6121652 (2000-09-01), Suzawa
patent: 6166414 (2000-12-01), Miyazaki et al.
patent: 6198133 (2001-03-01), Yamazaki et al.
patent: 6211533 (2001-04-01), Byun et al.
patent: 6259120 (2001-07-01), Zhang et al.
patent: 6281552 (2001-08-01), Kawasaki et al.
patent: 6414345 (2002-07-01), Suzawa
patent: 6448612 (2002-09-01), Miyazaki et al.
patent: 6524895 (2003-02-01), Yamazaki et al.
patent: 6566684 (2003-05-01), Suzawa
patent: 6576924 (2003-06-01), Yamazaki et al.
patent: 4-369271 (1992-12-01), None
patent: 5-102483 (1993-04-01), None
patent: 6258659 (1994-09-01), None
patent: 7-130652 (1995-05-01), None
patent: 8234212 (1995-09-01), None
patent: 9120072 (1997-05-01), None
U.S. Appl. No. 09/502,675 (pending) to Yamazaki filed Feb. 11, 2000, including specification, abstract, claims, drawings and PTO filing receipt.
U.S. Appl. No. 09/510,734 (pending) to Yamazaki filed Feb. 22, 2000, including specification, abstract, claims, drawings and PTO filing receipt.
U.S. Appl. No. 09/533,175 (pending) to Yamazaki et al filed Mar. 22, 2000, including specification, abstract, claims, drawings and PTO filing receipt.
U.S. Appl. No. 09/610,217 (pending) to Yamazaki et al filed Jul. 5, 2000, including specification, abstract, claims, drawings and PTO filing receipt.
Arai Yasuyuki
Koyama Jun
Yamazaki Shunpei
Brock II Paul E
Cook Alex McFarron Manzo Cummings & Mehler, Ltd.
Semiconductor Energy Laboratory Co,. Ltd.
LandOfFree
Semiconductor device and manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and manufacturing method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3469176