Probe card covering system and method

Details Probe card covering system and method Probe card covering system and method

2005-11-01

2005-11-01

Abrams, Neil (Department: 2839)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C439S135000, C439S136000

Reexamination Certificate

active

06960923

ABSTRACT:
A probe card covering system includes a probe card for testing a die on a wafer, the probe card having contacts adapted for electrical engagement with the die; a removable cover connected to the probe card and positionable in a first position over the contacts of the probe card, the cover being movable to a second position exposing said contacts for the engagement with the die; and, wherein the cover is movable from the first position to the second position while the probe card is located in a wafer testing machine.

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