Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate
2005-12-20
2005-12-20
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
C252S30140R, C435S091500
Reexamination Certificate
active
06977182
ABSTRACT:
This invention provides semiconductor nanoparticles having fluorescence properties and comprising a modifying group represented by the following general formula bound to their surfaces, a method for producing the same, and a fluorescence reagent comprising semiconductor nanoparticles:in-line-formulae description="In-line Formulae" end="lead"?—OYin-line-formulae description="In-line Formulae" end="tail"?wherein Y is selected from a hydrogen atom, a metal atom, a semimetal atom, an organic group, or an organic group that is intermediated by a metal atom or a semimetal atom. In this method, the surfaces of the semiconductor nanoparticles were modified with a hydroxyl group or the like for stabilization. This realizes the production of semiconductor nanoparticles having fluorescence properties that significantly emit only the band gap fluorescence, the production of which at the industrial level was previously very difficult due to the necessity of many processes and from the viewpoint of technology and safety.
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Kuwabata Susumu
Sato Keiichi
A. Marquez, Esq. Juan Carlos
Coleman W. David
Fisher Esq. Stanley P.
Hitachi Software Engineering Co., LTD
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