Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2005-08-23
2005-08-23
Chang, Rick Kiltae (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S846000, C427S097100, C427S099300
Reexamination Certificate
active
06931726
ABSTRACT:
A method of making an interconnect structure having an increased chip connector pad and plated through hole density is provided. In particular, the method includes the steps of providing a substrate having at least one plated through hole therein, and positioning a first conductive layer and a second conductive layer over the at least one plated through hole on opposing surfaces of the substrate. The method includes positioning a layer of dielectric material thereon on the first conductive layer. The dielectric layer includes at least one aperture selectively positioned directly over the at least one plated through hole. The substrate further includes a metal layer, and at least a pair of conductive layers that can carry signals, and power.
REFERENCES:
patent: 4882454 (1989-11-01), Peterson et al.
patent: 5231751 (1993-08-01), Sachdev et al.
patent: 5479703 (1996-01-01), Desai et al.
patent: 5537740 (1996-07-01), Shirai et al.
patent: 5569958 (1996-10-01), Bloom
patent: 5764485 (1998-06-01), Lebaschi
patent: 5774340 (1998-06-01), Chang et al.
patent: 5792375 (1998-08-01), Farquhar
patent: 5847327 (1998-12-01), Fischer et al.
patent: 5879787 (1999-03-01), Petefish
patent: 5925206 (1999-07-01), Boyko et al.
patent: 5948533 (1999-09-01), Gallagher et al.
patent: 6009620 (2000-01-01), Bhatt et al.
patent: 6015520 (2000-01-01), Appelt et al.
patent: 6051093 (2000-04-01), Tsukahara
patent: 6079100 (2000-06-01), Farquhar et al.
patent: 4010696 (1992-01-01), None
patent: 09064231 (1997-03-01), None
Boyko Christina M.
Farquhar Donald S.
Papathomas Konstantinos I.
Chang Rick Kiltae
International Business Machines - Corporation
Steinberg William H.
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