Top layers of metal for high performance IC's

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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C257S760000, C257S780000

Reexamination Certificate

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06965165

ABSTRACT:
A method of closely interconnecting integrated circuits contained within a semiconductor wafer to electrical circuits surrounding the semiconductor wafer. Electrical interconnects are held to a minimum in length by making efficient use of polyimide or polymer as an inter-metal dielectric thus enabling the integration of very small integrated circuits within a larger circuit environment at a minimum cost in electrical circuit performance.

REFERENCES:
patent: 5055907 (1991-10-01), Jacobs
patent: 5083187 (1992-01-01), Lamson et al.
patent: 5106461 (1992-04-01), Volfson et al.
patent: 5212403 (1993-05-01), Nakanishi et al.
patent: 5501006 (1996-03-01), Gehman, Jr. et al.
patent: 5635767 (1997-06-01), Wenzel et al.
patent: 5686764 (1997-11-01), Fulcher
patent: 5989991 (1999-11-01), Lien
patent: 6137155 (2000-10-01), Seshan et al.
patent: 6150725 (2000-11-01), Misawa et al.
patent: 6278174 (2001-08-01), Havemann et al.
Wolf, S., Silicon Processing for the VLSI Era, vol. 2, Lattice Press, 1990, pp. 214-217; 283-285.

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