Measuring plate

Details Measuring plate Measuring plate

2005-05-10

2005-05-10

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

Of light reflection

C250S239000

Reexamination Certificate

active

06891620

ABSTRACT:
A measuring plate for use in a sensor utilizing the phenomenon of attenuation in total internal reflection provides a dielectric block and a film layer and includes a dielectric plate provided with a plurality of recesses each provided with a film layer and holding a sample in contact with the film layer, and a reflecting optical system including a reflecting surface which is formed on the dielectric plate for each of the recesses to cause the light beam emitted from the light source to impinge upon the interface between the film layer of the recess and the dielectric plate and/or to cause the light beam reflected at the interface between the film layer of the recess and the dielectric plate to travel toward a predetermined position.

REFERENCES:
patent: 4595290 (1986-06-01), Nose et al.
patent: 4889427 (1989-12-01), Van Veen et al.
patent: 5341215 (1994-08-01), Seher
patent: 6577396 (2003-06-01), Naya
patent: 6597456 (2003-07-01), Kubo et al.
patent: 6741352 (2004-05-01), Naya
patent: 6-167443 (1994-06-01), None
Japanese Abstract No. 10300667, dated Nov. 13, 1998.
Japanese Abstract No. 200065729, dated Mar. 3, 2000.
Takayuki Okamoto, “Surface Refracto-Sensor using Evanescent Waves: Principles and Instrumentations” Sprectral Researches, vol. 47, No. 1 1998, pp21.

Affiliated with

Also associated with

Rating

Measuring plate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Measuring plate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measuring plate will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3456695