Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2005-10-11
2005-10-11
Dunn, Drew A. (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S738000, C359S739000
Reexamination Certificate
active
06954306
ABSTRACT:
A scanning microscope with a light source for illumination of a specimen, a means for spatial spectral division of the detection light, and a detector is disclosed. The scanning microscope has means for selecting a lower limit wavelength that defines a lower exclusion region, and means for selecting an upper limit wavelength that defines an upper exclusion region, as well as a first and a second adjustable stop that block light components of the lower and the upper exclusion region of the detection light. A bandpass filter and a method for scanning microscopy are also disclosed.
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European Search Report for EP 02 10 2510, Mar. 14, 2003 (1 page); and brief translation thereof (1 page).
Davidson Davidson & Kappel LLC
Dunn Drew A.
Leica Microsystems Heidelberg GmbH
Pritchett Joshua L
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