Objective lens for an electron microscopy system and...

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

Reexamination Certificate

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C250S310000, C250S311000, C250S398000

Reexamination Certificate

active

06855938

ABSTRACT:
An objective lens with magnetic and electrostatic focusing for an electron microscopy system is provided whose at least partially conical outer shape allows orienting an object to be imaged at a large angle range in respect of an electron beam, said objective lens exhibiting, at the same time, good optical parameters. This is enabled by a specific geometry of the lens elements. Furthermore, an examination for the simultaneous imaging and processing of an object is proposed which comprises, besides an electron microscopy system with the above-mentioned objective lens, also an ion beam processing system and an object support.

REFERENCES:
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patent: 20030010914 (2003-01-01), Takane et al.
patent: 198 45 329 (2001-09-01), None
patent: 0 333 018 (1989-09-01), None
patent: 2002056794 (2002-02-01), None
patent: 997135 (1983-02-01), None
J. Frosien et al., “Compound magnetic and electrostatic lenses for low-voltage applications”, J. Vac. Sci. Technol. B 7(8), Nov./Dec. 1989, pp. 1874-1877, American Vacuum Society.

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