Complex signal decomposition and modeling

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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C702S070000, C702S071000, C702S073000, C702S074000, C702S190000

Reexamination Certificate

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06957172

ABSTRACT:
A system, method and program product for monitoring a complex signal for ultrasensitive detection of state changes, or for signature recognition and classification is provided. A complex signal is decomposed periodically for empirical modeling. Wavelet analysis, frequency band filtering or other methods may be used to decompose the complex signal into components. A library of signature data may be referenced for selection of a recognized signature in the decomposed complex signal. The recognized signature may indicate data being carried in the complex signal. Estimated signal data may be generated for determination of an operational state of a monitored process or machine using a statistical hypothesis test with reference to the decomposed input signal.

REFERENCES:
patent: 3045221 (1962-07-01), Roop
patent: 4336595 (1982-06-01), Adams et al.
patent: RE31750 (1984-11-01), Morrow
patent: 4480480 (1984-11-01), Scott et al.
patent: 4639882 (1987-01-01), Keats
patent: 4707796 (1987-11-01), Calabro et al.
patent: 4761748 (1988-08-01), Le Rat et al.
patent: 4796205 (1989-01-01), Ishii et al.
patent: 4823290 (1989-04-01), Fasack et al.
patent: 4841456 (1989-06-01), Hogan, Jr. et al.
patent: 4937763 (1990-06-01), Mott
patent: 4978909 (1990-12-01), Hendrix et al.
patent: 5003950 (1991-04-01), Kato et al.
patent: 5025499 (1991-06-01), Inoue et al.
patent: 5052630 (1991-10-01), Hinsey et al.
patent: 5093792 (1992-03-01), Taki et al.
patent: 5113483 (1992-05-01), Keeler et al.
patent: 5119287 (1992-06-01), Nakamura et al.
patent: 5123017 (1992-06-01), Simpkins et al.
patent: 5195046 (1993-03-01), Gerardi et al.
patent: 5210704 (1993-05-01), Husseiny
patent: 5223207 (1993-06-01), Gross et al.
patent: 5251285 (1993-10-01), Inoue et al.
patent: 5285494 (1994-02-01), Sprecher et al.
patent: 5311562 (1994-05-01), Palusamy et al.
patent: 5327349 (1994-07-01), Hoste
patent: 5386373 (1995-01-01), Keeler et al.
patent: 5420571 (1995-05-01), Coleman et al.
patent: 5421204 (1995-06-01), Svaty, Jr.
patent: 5446672 (1995-08-01), Boldys
patent: 5455777 (1995-10-01), Fujiyama et al.
patent: 5459675 (1995-10-01), Gross et al.
patent: 5481647 (1996-01-01), Brody et al.
patent: 5495168 (1996-02-01), de Vries
patent: 5500940 (1996-03-01), Skeie
patent: 5502543 (1996-03-01), Aboujaoude
patent: 5526446 (1996-06-01), Adelson et al.
patent: 5539638 (1996-07-01), Keeler et al.
patent: 5548528 (1996-08-01), Keeler et al.
patent: 5553239 (1996-09-01), Heath et al.
patent: 5561431 (1996-10-01), Peele et al.
patent: 5574387 (1996-11-01), Petsche et al.
patent: 5586066 (1996-12-01), White et al.
patent: 5600726 (1997-02-01), Morgan et al.
patent: 5629878 (1997-05-01), Kobrosly
patent: 5638413 (1997-06-01), Uematsu et al.
patent: 5640103 (1997-06-01), Petsche et al.
patent: 5657245 (1997-08-01), Hecht et al.
patent: 5663894 (1997-09-01), Seth et al.
patent: 5668944 (1997-09-01), Berry
patent: 5671635 (1997-09-01), Nadeau et al.
patent: 5680409 (1997-10-01), Qin et al.
patent: 5682317 (1997-10-01), Keeler et al.
patent: 5699403 (1997-12-01), Ronnen
patent: 5708780 (1998-01-01), Levergood et al.
patent: 5710723 (1998-01-01), Hoth et al.
patent: 5727144 (1998-03-01), Brady et al.
patent: 5745382 (1998-04-01), Vilim et al.
patent: 5748469 (1998-05-01), Pyötsiä
patent: 5757309 (1998-05-01), Brooks et al.
patent: 5761090 (1998-06-01), Gross et al.
patent: 5764509 (1998-06-01), Gross et al.
patent: 5774379 (1998-06-01), Gross et al.
patent: 5784285 (1998-07-01), Tamaki et al.
patent: 5787138 (1998-07-01), Ocieczek et al.
patent: 5790977 (1998-08-01), Ezekiel
patent: 5796633 (1998-08-01), Burgess et al.
patent: 5799043 (1998-08-01), Chang et al.
patent: 5822212 (1998-10-01), Tanaka et al.
patent: 5845230 (1998-12-01), Lamberson
patent: 5864773 (1999-01-01), Barna et al.
patent: 5886913 (1999-03-01), Marguinaud et al.
patent: 5895177 (1999-04-01), Iwai et al.
patent: 5905989 (1999-05-01), Biggs
patent: 5909368 (1999-06-01), Nixon et al.
patent: 5913911 (1999-06-01), Beck et al.
patent: 5930779 (1999-07-01), Knoblock et al.
patent: 5933352 (1999-08-01), Salut
patent: 5933818 (1999-08-01), Kasravi et al.
patent: 5963884 (1999-10-01), Billington et al.
patent: 5970430 (1999-10-01), Burns et al.
patent: 5987399 (1999-11-01), Wegerich et al.
patent: 5995916 (1999-11-01), Nixon et al.
patent: 6006260 (1999-12-01), Barrick, Jr. et al.
patent: 6023507 (2000-02-01), Wookey
patent: 6026348 (2000-02-01), Hala
patent: 6049827 (2000-04-01), Sugauchi et al.
patent: 6076088 (2000-06-01), Paik et al.
patent: 6104965 (2000-08-01), Lim et al.
patent: 6128543 (2000-10-01), Hitchner
patent: 6181975 (2001-01-01), Gross et al.
patent: 6539343 (2003-03-01), Zhao et al.
patent: 6731990 (2004-05-01), Carter et al.
patent: WO 00/67412 (2000-11-01), None
“Application of A New Technique For Modeling System Behavior” by Paul J. O'Sullivan, presented at the ISA Symposium, Edmonton, Alberta, May 1, 1991, © Copyright 1991 Instrument Society of America (21 pp.).
“A Universal, Fault-Tolerant, Non-Linear Analytic Network For Modeling And Fault Detection,” by J. E. Mott, R. W. King, L. R. Monson, D. L. Olson, and J. D. Staffon, Proceedings of the 8th Power Plant Dynamics, Control & Testing Symposium, Knoxville, Tennessee, May 27-29, 1992 (14 pp.).
ModelWare™ Product Review by Robert D. Flori, reprinted from Computerized Investing, Sep./Oct. 1992, vol. XI, No. 5 copyright by The American Association of Individual Investors (pp. 8-10).
ModelWare™ A New Approach to Prediction by Ken Tucker, reprinted from PC Al magazine, Jan./Feb. 1993, pp. 14, 15, 30.
“Similarity Based Regression: Applied Advanced Pattern Recognition for Power Plant Analysis,” by E. J. Hansen and M. B. Caudill, presented at the 1994 EPRI Heat Rate Improvement Conference (9 pp.).
“Applied Pattern Recognition For Plant Monitoring And Data Validation,” by Ron Griebenow, E. J. Hansen, and A. L. Sudduth, presented at the Fifth International Joint ISA POWID/EPRI Controls and Instrumentation Conference, La Jolla, California, Jun. 19-21, 1995 (11 pp.).
“Model-Based Nuclear Power Plant Monitoring And Fault Detection: Theoretical Foundations,” by Ralph M. Singer, Kenny C. Gross, James P. Herzog, Ronald W. King, and Stephan Wegerich, presented at the International Conference on Intelligent System Application to Power Systems (ISAP '97), Jul. 6-10, 1997, Seoul, Korea (pp. 60-65).
“Application Of A Model-Based Fault Detection System To Nuclear Plant Signals,” by K. C. Gross, R. M. Signer, S. W. Wegerich, J. P. Herzog, R. VanAlstine, and F. Bockhorst, presented at the International Conference on Intelligent System Application to Power Systems (ISAP '97), Jul. 6-10, 1997, Seoul, Korea (pp. 66-70).
“MSET Modeling Of Crystal River-3 Venturi Flow Meters” by J. P. Herzog, S. W. Wegerich, K. C. Gross, and F. K. Bockhorst, 6th International Conference on Nuclear Engineering, ICONE-6169, May 10-14, 1998, Copyright © 1998 ASME (12 pp.).

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