Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2005-02-08
2005-02-08
Norton, Nadine G. (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C252S079100, C252S079400
Reexamination Certificate
active
06852632
ABSTRACT:
The invention provides a method for polishing one or more layers of a multi-layer substrate that includes a first metal layer and a second layer comprising (i) contacting the first metal layer with a polishing system comprising a liquid carrier, at least one oxidizing agent, at least one polishing additive that increases the rate at which the system polishes at least one layer of the substrate, wherein the polishing additive is selected from the group consisting of pyrophosphates, condensed phosphates, phosphonic acids and salts thereof, amines, amino alcohols, amides, imines, imino acids, nitriles, nitros, thiols thioesters, thioethers, carbothiolic acids, carbothionic acids, thiocarboxylic acids, thiosalicylic acids, and mixtures thereof, and a polishing pad and/or an abrasive, and (ii) polishing the first metal layer with the system until at least a portion of the first metal layer is removed from the substrate.
REFERENCES:
patent: 4051057 (1977-09-01), Ericson et al.
patent: 4404074 (1983-09-01), Tomaszewski
patent: 4452643 (1984-06-01), Martin et al.
patent: 4875973 (1989-10-01), Heikkila et al.
patent: 4968381 (1990-11-01), Prigge et al.
patent: 5223087 (1993-06-01), Itani et al.
patent: 5230833 (1993-07-01), Romberger et al.
patent: 5366542 (1994-11-01), Yamada et al.
patent: 5709588 (1998-01-01), Muroyama
patent: 5770095 (1998-06-01), Sasaki et al.
patent: 5773364 (1998-06-01), Farkas et al.
patent: 5783489 (1998-07-01), Kaufman et al.
patent: 5788830 (1998-08-01), Sakamoto et al.
patent: 5855633 (1999-01-01), Simandl et al.
patent: 5897375 (1999-04-01), Watts et al.
patent: 5904159 (1999-05-01), Kato et al.
patent: 5954997 (1999-09-01), Kaufman et al.
patent: 5972792 (1999-10-01), Hudson
patent: 6001730 (1999-12-01), Farkas et al.
patent: 6096652 (2000-08-01), Watts et al.
patent: 6274063 (2001-08-01), Li et al.
patent: 6290736 (2001-09-01), Evans
patent: 20020081853 (2002-06-01), Beitel et al.
patent: 0 845 512 (1998-06-01), None
patent: 0 896 042 (1999-02-01), None
patent: 0 913 442 (1999-05-01), None
patent: 63-96599 (1988-04-01), None
patent: 1-270512 (1989-10-01), None
patent: 3232980 (1991-10-01), None
patent: 11172467 (1999-06-01), None
patent: WO 0077107 (2000-12-01), None
patent: WO 0144396 (2001-06-01), None
Brusic Kaufman Vlasta
Cherian Isaac K.
Grumbine Steven K.
Wang Shumin
Zhou Renjie
Cabot Microelectronics Corporation
Norton Nadine G.
Umez-Eronini Lynette T.
LandOfFree
Method of polishing a multi-layer substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of polishing a multi-layer substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of polishing a multi-layer substrate will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3454689