Techniques for measurement of deformation of electronically...

Communications: directive radio wave systems and devices (e.g. – Testing or calibrating of radar system – By monitoring

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C342S165000, C342S174000, C342S175000, C342S195000, C342S196000, C342S368000, C342S371000, C342S377000

Reexamination Certificate

active

06954173

ABSTRACT:
Techniques for simultaneous measurement of multiple array elements of an array antenna. The array is illuminated with a coherent signal source, and each array element phase shifter is cycled through a range of phase shifter settings at a unique rate. The phase shifted signals from each array element are combined to provide a composite signal. The composite signal is processed to extract the phase of the coherent source signal as received at each element. The phase information is used to determine the location of the elements relative to each other.

REFERENCES:
patent: 5003314 (1991-03-01), Berkowitz et al.
patent: 6215458 (2001-04-01), Aguttes et al.
patent: 6333712 (2001-12-01), Haugse et al.
patent: 6703970 (2004-03-01), Gayrard et al.
patent: 2002124817 (2002-04-01), None
1999 IEEE, pp. 172-176, “In Orbit Active Array Calibration for NASA's LightSAR,” Daniel S. Purdy, Anthony Jacome-Hood, Lockheed Martin Corporation.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Techniques for measurement of deformation of electronically... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Techniques for measurement of deformation of electronically..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Techniques for measurement of deformation of electronically... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3448008

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.