Semiconductor device with base formed by the junction of two sem

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Combined with field effect transistor

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257152, 257153, 257264, 257266, 257287, H01L 2974, H01L 31111

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active

056024053

ABSTRACT:
A semiconductor device, by which a base in which gates are buried can be formed by the junction of semiconductor substrates to each other at a lower temperature, and a fabrication process thereof are provided. Recesses are defined in the top of an N.sup.- substrate. A P.sup.+ layer is formed on the underside of the N.sup.- substrate. P.sup.+ -Gate regions are each formed in an area ranging from the bottom to lower side portions of the recesses. A metal layer composed of an Au-Sb alloy is formed on the underside of the N.sup.+ substrate. The N.sup.- substrate and the N.sup.+ substrate are subjected to a treatment for removing impurities thereon with an aqueous solution of sulfuric acid and hydrogen peroxide, washed with purified water and dried by a spin dryer. The N.sup.- substrate and the N.sup.+ substrate are heated at about 350.degree. C. in a hydrogen atmosphere in a state that the tops of projections between the recesses have been brought into contact with the metal layer provided on the underside of the N.sup.+ substrate, whereby the N.sup.- substrate and the N.sup.+ substrate are joined to each other.

REFERENCES:
patent: 4198645 (1980-04-01), Nishizawa
patent: 4341011 (1982-07-01), Okano et al.
patent: 4587712 (1986-05-01), Bolign
patent: 4654679 (1987-03-01), Muraoka
patent: 4829348 (1989-05-01), Broich et al.
patent: 4835586 (1989-05-01), Cogan et al.
patent: 4872044 (1989-10-01), Nishizawa et al.
patent: 5298787 (1994-03-01), Bozler et al.
A. Fukuroda et al., "Si Wafer Bonding with Ta Silicide Formation", 30 Japan J. Applied Physics 1693-1695 (Oct. 1991).
J. Nishizawa, "High-power vertical joint FET with triode characteristics", Nikkei Electronics, vol. 1971, 9, 27, pp. 50-61 (with partial translation).
J. Nishizawa et al., "Field-Effect Transistor Versus Analog Transistor (Static Induction Transistor)", IEEE Trans. on Electron Devices, vol. ED-22 No. 4, Apr. 1975, pp. 185-197.
J. Nishizawa et al. "Static Induction Thyristor", Rev. de Physiquee Appliquee, TOME 13, Dec. 78, pp. 725-728.
J. Nishizawa et al., "Effects of Gate Structure on Static Induction Thyristor", Tech. Dig. 1980 IEDM, 1980, pp. 658-661.
"Analysis of Characteristic of Static Induction Thyristor", Technical Research Report, Electronics Comm. Soc., ED81-84 (1981), pp. 31-38 (with partial translation).
"Static Induction Thyristor", Technical Research Report, Electronics Comm. Soc, ED81-7 (1981) pp. 49-55 (with partial translation).

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