Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-04-05
2005-04-05
Hjerpe, Richard (Department: 2672)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C345S440100, C702S066000, C702S067000, C702S068000, C702S070000
Reexamination Certificate
active
06876937
ABSTRACT:
A method of displaying a number of measurement curves is described. The measurement curves are displayed in at least two windows. Each one of the windows comprises two axes. One or more measurement curves are displayed in each one of the windows. The method comprises the steps of changing the scale of one of the curves in the direction of at least one of the two axes by a user and synchronizing at least one of the other curves of one or more other windows with respect to one of the two axes depending on said change carried out by the user.
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patent: 5898307 (1999-04-01), Taraki et al.
patent: 20010001137 (2001-05-01), Alexander
patent: 2836500 (1980-03-01), None
patent: 0267722 (1988-05-01), None
patent: WO 0214792 (2002-02-01), None
Agilent Technologie,s Inc.
Hjerpe Richard
Lay Michelle K.
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