System and method of monitoring, predicting and optimizing...

Details System and method of monitoring, predicting and optimizing... System and method of monitoring, predicting and optimizing...

2005-09-27

2005-09-27

Pert, Evan (Department: 2826)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C702S120000

Reexamination Certificate

active

06949944

ABSTRACT:
A system and method of monitoring LCD production yields, predicting the effects of different testing methodologies on LCD production yields, and optimizing production yields is provided that compares the effect of different testing methodologies on the yields at various stages in the LCD testing and assembly process. The present invention can also be used to predict the effect of different testing methodologies on user-defined parameters, such as profit.

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