Static information storage and retrieval – Floating gate
Reexamination Certificate
2005-05-31
2005-05-31
Nguyen, Viet Q. (Department: 2818)
Static information storage and retrieval
Floating gate
C257S314000, C257S315000, C257S319000, C257S320000, C257S326000
Reexamination Certificate
active
06901006
ABSTRACT:
In a semiconductor integrated circuit device including a third gate, the present invention improves miniaturization and operation speed and reduces a defect density of an insulator film. In a semiconductor integrated circuit device including a well of a first conductivity type formed in a semiconductor substrate, a source/drain diffusion layer of a second conductivity type inside the well, a floating gate formed over the semiconductor substrate through an insulator film, a control gate formed and isolated from the floating gate through an insulator film, word lines formed by connecting the control gates and a third gate formed and isolated from the semiconductor substrate, the floating gate and the control gate through an insulator film and different from the floating gate and the control gate, the third gate is buried into a space of the floating gates existing in a direction vertical to the word line and a channel.
REFERENCES:
patent: 5095344 (1992-03-01), Harari
patent: 5247198 (1993-09-01), Homma et al.
patent: 5392238 (1995-02-01), Kirisawa
patent: 5502669 (1996-03-01), Saitoh
patent: 5679970 (1997-10-01), Hartmann
patent: 5719805 (1998-02-01), Masuoka
patent: 5745412 (1998-04-01), Choi
patent: 5761121 (1998-06-01), Chang
patent: 5767930 (1998-06-01), Kobayashi et al.
patent: 5780341 (1998-07-01), Ogura
patent: 5883409 (1999-03-01), Guterman et al.
patent: 5907444 (1999-05-01), Fong
patent: 6027974 (2000-02-01), Liu et al.
patent: 6369410 (2002-04-01), Yamazaki et al.
patent: 6438028 (2002-08-01), Kobayashi et al.
patent: 2001/0001295 (2001-05-01), Odanaka et al.
patent: 2001/0011726 (2001-08-01), Havashi et al.
patent: 2002/0096681 (2002-07-01), Yamazaki et al.
patent: 2002/0125510 (2002-09-01), Chyanagi et al.
patent: 2002/0191458 (2002-12-01), Kobayashi et al.
patent: 195 00 380 (1995-11-01), None
patent: 0245515 (1987-11-01), None
patent: 0326 465 (1989-08-01), None
patent: 0349884 (1990-01-01), None
patent: 405048108 (1993-02-01), None
patent: 406252417 (1994-09-01), None
patent: 2694618 (1997-10-01), None
patent: 9321157 (1997-12-01), None
patent: 02000174241 (2000-06-01), None
“A New Flash-Erase EEprom Cell With A Sidewall Select-Gate On Its Source Side” N. Naruka, IEDM-1989, pp. 603-606.
“Ohyo Butsuri Or Applied Physics” vol. 65, No. 11, pp. 1114-1124.
Intellectual Property Office of Singapore Office Action dated Oct. 28, 2004.
Kimura Katsutaka
Kobayashi Naoki
Kobayashi Takashi
Kume Hitoshi
Kurata Hideaki
Hitachi Device Engineering & Co., Ltd.
Nguyen Viet Q.
LandOfFree
Semiconductor integrated circuit device including first,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor integrated circuit device including first,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device including first,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3439263