Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1995-05-25
1997-02-11
Williams, Hezron E.
Measuring and testing
Surface and cutting edge testing
Roughness
G01B 528
Patent
active
056023308
ABSTRACT:
The present invention comprises a highly sensitive non-contact force microscope having a coaxial cantilever-tip configuration and a method of forming such configuration. The non-contact microscope obtains high resolution graphical images of a sample surface topography, and/or other properties thereof including its electrostatic, magnetic, or Van der Waals forces.
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Chamberlin Ralph V.
DiCarlo Anthony
Arizona Board of Regents acting on behalf of Arizona State Unive
Larkin Daniel S.
Mybeck Richard R.
Scull Peter B.
Williams Hezron E.
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