Method of and apparatus for testing the quality of printed...

Details Method of and apparatus for testing the quality of printed... Method of and apparatus for testing the quality of printed...

2005-04-19

2005-04-19

Niebling, John F. (Department: 2812)

Semiconductor device manufacturing: process

With measuring or testing

Reexamination Certificate

active

06881595

ABSTRACT:
Electronic circuits or the parts thereof on printed circuit boards are tested by detecting infrared radiation emitted by the surface of the circuit. The detected radiation is converted to data that represent a surface structure and/or depth structure of the circuit. Deviation between the data representing the detected surface structure and/or depth structure and data representing the desired stated of the surface structure and/or depth structure are determined.

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Feldmann et al., “Herausforderung Qualität-Prüfstrategien im Wandel: Durchblick im optischen Test,”Die Fachzeitschrift fär Elektronik-Ferigung und Test, 1997, pp. 26-28, Heft 1/2.

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