Insulative covering of probe tips

Details Insulative covering of probe tips Insulative covering of probe tips

2005-03-22

2005-03-22

Gilman, Alex (Department: 2833)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020

Reexamination Certificate

active

06870381

ABSTRACT:
An insulative material is applied to one or more selected probe tips to disable those probes, and the probes are brought into contact with a semiconductor die. One or more tests are run on the die to verify sufficient testing of the die without the disabled probes. The process may be repeated with other probes disabled to determine which probes need not be used in testing the die.

REFERENCES:
patent: 5831441 (1998-11-01), Motooka et al.
patent: 6181145 (2001-01-01), Tomita et al.
patent: 6211691 (2001-04-01), Okuno
patent: 6366112 (2002-04-01), Doherty et al.
patent: 6563215 (2003-05-01), Akram et al.
patent: 6800506 (2004-10-01), Lin et al.

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