Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-03-15
2005-03-15
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S116000, C702S189000, C702S193000
Reexamination Certificate
active
06868350
ABSTRACT:
A method for operating a sensing device. The method comprising: a sensor film having an electrical resistance that is adapted to change in response to the presence of a predetermined condition; detecting the presence of the predetermined condition; measuring the electrical resistance of the sensor film at a first time; measuring the electrical resistance of the sensor film at a second time; determining a rate of change of the electrical resistance between the first time and the second time; and comparing the rate of change of the electrical resistance against a threshold value.
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Communication, including European Search Report, from the European Patent Office, Aug. 5, 2004.
Bostic Lance A.
Khadkikar Prasad S.
Zimmermann Bernd D.
Bui Bryan
Harness Dickey & Pierce PLC
Therm-O-Disc Incorporated
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