Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-09-20
2005-09-20
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S127000, C250S340000, C359S368000
Reexamination Certificate
active
06947861
ABSTRACT:
The method implements time-optimized acquisition of special spectra using a scanning microscope, for which purpose the spectrum is subjected to bisecting interval measurements. The method for time-optimized acquisition of special spectra (emission spectra) using a scanning microscope is implemented in several steps. Firstly a complete spectrum to be examined, within which at least one special spectrum (emission spectrum) is located, is split into at least two intervals. The interval in which the intensity lies above a specific threshold is selected. That interval is split into at least two further intervals, and the procedure is continued until the size of the interval corresponds to the lower limit of the scanning microscope's measurement accuracy. The location of the special spectrum in the complete spectrum is defined, and an interval around it is created and is measured linearly.
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patent: 6388807 (2002-05-01), Knebel et al.
patent: 6483103 (2002-11-01), Engelhardt et al.
patent: 6614031 (2003-09-01), Engelhardt et al.
patent: 100 06 800 (2001-08-01), None
Houston Eliseeva LLP
Leica Microsystems Heidelberg GmbH
Wachsman Hal
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