Integrated circuit device and correction method for...

Details Integrated circuit device and correction method for... Integrated circuit device and correction method for...

2005-01-11

2005-01-11

Pascal, Robert (Department: 2829)

Semiconductor device manufacturing: process

Including control responsive to sensed condition

Electrical characteristic sensed

C073S001010

Reexamination Certificate

active

06841401

ABSTRACT:
An integrated circuit device has a device main body1having a predetermined circuit function of providing an output corresponding to an input thereto, and is provided with a power supply section4for receiving through a coil3electromagnetic wave energy applied from outside to generate predetermined internal electric power required to operate the integrated circuit device. The integrated circuit device further includes a calibration data acquisition circuit (operation control section5) for detecting the output of the device main body1operated in a predetermined operating environment to obtain calibration data on the device main body, and a nonvolatile memory6for storing the calibration data. Using the calibration data stored in the nonvolatile memory, the output of the device main body1during actual use of the integrated circuit device is corrected (calibrated), whereby deviation or dispersion of the output or output characteristic of the device main body attributable to an individual difference thereof is efficiently corrected with ease.

REFERENCES:
patent: 5394105 (1995-02-01), Axer
patent: 5440302 (1995-08-01), Irmer et al.
patent: 5519644 (1996-05-01), Benton
patent: 6529127 (2003-03-01), Townsend et al.
patent: 59-225323 (1984-12-01), None
patent: 62-826 (1987-01-01), None
patent: WO 9425105 (1994-11-01), None

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