System and method for monitoring and evaluating solid and...

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S309000, C209S577000

Reexamination Certificate

active

06919556

ABSTRACT:
An system and method for monitoring and evaluating solid and semi-solid materials. In an embodiment adapted for pharmaceutical manufacturing, a rotating platter is provided which contains a plurality of chutes. Manufactured items from an earlier section of the manufacturing process are deposited upon the rotating platter, and are separated for analysis by the plurality of chutes. Mounted near the edge radius of the platter is a Raman probe, which focuses photons from a laser onto each of the manufactured items. The manufactured items radiate photons according to Raman scattering principles, which are collected by the Raman probe and analyzed by a computer against a template file. The computer operates upon the chutes to sort and release the manufactured items according to a criteria. Thus, an in-process monitoring and evaluation system may be utilized to inspect and sort manufactured items in real time.

REFERENCES:
patent: 5085510 (1992-02-01), Mitchell
patent: 5094786 (1992-03-01), Nagashima et al.
patent: 5638657 (1997-06-01), Archer et al.
patent: 6067154 (2000-05-01), Hossain et al.
patent: 6324253 (2001-11-01), Yuyama et al.
patent: 2002/0012118 (2002-01-01), Worster et al.
patent: 2002/0048610 (2002-04-01), Cima et al.
patent: 2002/0109110 (2002-08-01), Some et al.
patent: 2002/0125434 (2002-09-01), Folestad et al.
patent: 2002/0177167 (2002-11-01), Levinson et al.
Inspection Machines ATI and ACI, [online], [retrieved on May 22, 2003]. Retrieved from the Internet <URL: http://www.seidenader.de/2-SE-e/+2-Progr-ATI-b.html>.
Inspection Machine PI/PI-B, [online], [retrieved on May 16, 2003]. Retrieved on the Internet <URL: http://www.seidenader.de/2-SE-e/+2-Progr-PI-b.html>.
System Inspects Blister Pack Reliably and Economically, [online], [retrieved on May 16, 2003]. Retrieved from the Internet <URL: http://devicelink.com/pmpn/archive/98/03/007.html>.
Expanding Vision's Line of Sight, [online], [retrieved on May 16, 2003]. Retrieved from the Internet <URL: http://www.devicelink.com/pmpn/archive/01/10/001.html>.
Inspecting Machines, Packaging Support Specialty Equipment, [online], [retrieved on May 16, 2003]. Retrieved from the Internet <URL: http://www.packexpo.com/ve/38995/main.html>.
Inspecting Blister Packs with NIR, [online], [retrieved on May 16, 2003]. Retrieved from the Internet <URL: http://www.packagingdigest.com/articles/200203/64.html>.
Antaris® FT-Near Infrared Tablet Analyzer, [online], [retrieved on May 16, 2003]. Retrieved from the Internet <URL: http://www.thermo.com/eThermo/CDA/Products/Product_Detail/1.1075.17087-104-X.00.html>.
Raman Spectroscopy, [online], [retrieved May 16, 2003]. Retrieved from the Internet <URL: http://www.iyhoriba.co.uk/iy/raman/images/polymerizationmonitoring.pdf>.
Raman Without Compromise, [online], [retrieved May 16, 2003]. Retrieved from the Internet <URL: http://www.avaloninst.com>.
ChemImage Corp.,-FALLON Raman Chemical Imaging Microscope, [online], [retrieved May 16, 2003]. Retrieved from the Internet <URL: http://www.chemimage.com/products>.
In situ and on-line RAM on spectroscopy to the analysis of semiconductor heterostructures from ZnSxSel-x and group iii-nitrides, [online], [retrieved on May 16, 2003]. Retrieved from the Internet: Electronically Translated from German using Google translation service <URL: http://translate.google.com/translate?hl =en&sl=de&u=http://archiv.tu-chemnitz.de/pub/2002/0036/&prev=/ Search%3Fq%3Donline%2BRaman%26hl% 3Den%26lr%3D%26ie%3DUTF-8%26oe%3DUTF-8%26sa%3DG>.
Analytical Spectral Devices Near—Infrared Analyzers QualitySpec, [online], [retrieved May 23, 2003]. Retrieved from the Internet <URL: http://www.asdi.com/asdi_t2_pr_ne_qs.html>.
Pharmaceutical Inspection System, as seen in Medical Equipment Designer—Lasers & Optics, [online], [retrieved May 23, 2003]. Retrieved from the Internet <URL: http://manufacturingcenter.com/med/archives/0797/797prdspt.html>.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for monitoring and evaluating solid and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for monitoring and evaluating solid and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for monitoring and evaluating solid and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3428215

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.