Electronic component production method and burn-in apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S765010

Reexamination Certificate

active

06919733

ABSTRACT:
An electronic component production method for subjecting an electronic component to burn-in, in which a load equivalent to a predetermined load defined by a burn-in temperature, a burn-in voltage, and a burn-in time is applied to the electronic component, includes a first step of setting the temperature of the electronic component to a predetermined temperature which is lower than the burn-in temperature; a second step of applying constant power to the electronic component to increase the temperature of the electronic component from the predetermined temperature to the burn-in temperature; and a third step of comparing an actual voltage which is applied to the electronic component at the burn-in temperature with the burn-in voltage and correcting the burn-in time based on the difference therebetween to determine a corrected burn-in time, and applying the constant power to the electronic component for the corrected burn-in time.

REFERENCES:
patent: 3745460 (1973-07-01), Belzer et al.
patent: 5473259 (1995-12-01), Takeda
patent: 6574763 (2003-06-01), Bertin et al.
patent: 6-102312 (1994-04-01), None
patent: 2000-164471 (2000-06-01), None
patent: 2000-208380 (2000-07-01), None

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