Wavelength monitoring device and method of tunable laser...

Optics: measuring and testing – By light interference – Having partially reflecting plates in series

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C372S028000

Reexamination Certificate

active

06885462

ABSTRACT:
There are disclosed a wavelength monitoring device of tunable laser sources and a method thereof. A Fabry-Perot etalon is provided to detect the wavelength drift, and furthermore, a Fabry-Perot laser diode or a light emitting diode is provided to recognize the channel of the wavelength. The wavelength drift is used to determine the junction voltage of each corresponding channel in advance. Then, the actually detected junction voltage of the diode is used to determine the channel of the wavelength, thereby accurately detecting the actual channel wavelength.

REFERENCES:
patent: 6291813 (2001-09-01), Ackerman et al.
patent: 6611341 (2003-08-01), May
Optical Fiber Communications Conference and Exhibit 2002; Mar. 17-22, 2002; Anaheim Convention Center, Anaheim, California; pp. 393-395.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Wavelength monitoring device and method of tunable laser... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Wavelength monitoring device and method of tunable laser..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wavelength monitoring device and method of tunable laser... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3419055

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.