Optics: measuring and testing – By light interference – Having partially reflecting plates in series
Reexamination Certificate
2005-04-26
2005-04-26
Lee, Andrew H. (Department: 2877)
Optics: measuring and testing
By light interference
Having partially reflecting plates in series
C372S028000
Reexamination Certificate
active
06885462
ABSTRACT:
There are disclosed a wavelength monitoring device of tunable laser sources and a method thereof. A Fabry-Perot etalon is provided to detect the wavelength drift, and furthermore, a Fabry-Perot laser diode or a light emitting diode is provided to recognize the channel of the wavelength. The wavelength drift is used to determine the junction voltage of each corresponding channel in advance. Then, the actually detected junction voltage of the diode is used to determine the channel of the wavelength, thereby accurately detecting the actual channel wavelength.
REFERENCES:
patent: 6291813 (2001-09-01), Ackerman et al.
patent: 6611341 (2003-08-01), May
Optical Fiber Communications Conference and Exhibit 2002; Mar. 17-22, 2002; Anaheim Convention Center, Anaheim, California; pp. 393-395.
Chou Yun-Lung
Lee San-Liang
Yang Chun-Liang
Bacon & Thomas PLLC
Industrial Technology Research Institute
Lee Andrew H.
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