System and method for measuring transistor leakage current...

Details System and method for measuring transistor leakage current... System and method for measuring transistor leakage current...

2005-04-26

2005-04-26

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06885210

ABSTRACT:
A circuit and method thereof for measuring leakage current are described. The circuit includes a pre-charge device subject to a first backbias voltage and a leakage test device subject to a second backbias voltage. The leakage test device is coupled to the pre-charge device. The leakage test device is biased to an off state. A differential amplifier is coupled to the pre-charge device and the leakage test device. A delay unit is coupled to the differential amplifier and to an input of the pre-charge device. The pre-charge device is turned on and off at a frequency that corresponds to said leakage current.

REFERENCES:
patent: 4739252 (1988-04-01), Malaviya et al.
patent: 5410278 (1995-04-01), Itoh et al.
patent: 5568103 (1996-10-01), Nakashima et al.
patent: 6011403 (2000-01-01), Gillette
patent: 6407571 (2002-06-01), Furuya et al.
patent: 6426641 (2002-07-01), Koch et al.
patent: 6657504 (2003-12-01), Deal et al.
patent: 6815971 (2004-11-01), Wang et al.

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