Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate
2005-03-22
2005-03-22
Niebling, John F. (Department: 2812)
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
Reexamination Certificate
active
06870622
ABSTRACT:
A method and device are for monitoring electric components in a pick-and-place device for substrates. The underside of a pick-up is monitored by an optical scanner during the pick-up phase and during the placing phase of a component. A lift drive for the pick-up is provided with a position sensor that is linked with a control device. The scanner emits and receives a scanning beam oriented transversally to the direction of lift and is likewise coupled with the control device, thereby allowing monitoring of the underside of the pick-up in a direct time-related manner with the picking and placing of the component. The various lift positions are saved and compared when a threshold value of the received scanning beam is exceeded so that the inventive device also allows for a monitoring of the height of the component.
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Burger Stefan
Duebel Rainer
Harness & Dickey & Pierce P.L.C.
Niebling John F.
Siemens Aktiengesellschaft
Stevenson Andre′ C.
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