Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2005-09-13
2005-09-13
Lamarre, Guy J. (Department: 2133)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S601000
Reexamination Certificate
active
06943563
ABSTRACT:
An S-parameter measurement technique allows measurement of devices under test (DUTs), such as power amplifiers, which require a modulated power tone drive signal for proper biasing, in combination with a probe tone test signal, wherein both the modulated and probe tone signals operate in the same frequency range. The technique uses a stochastic drive signal, such as a CDMA or WCDMA modulated signal in combination with a low power probe tone signal. A receiver in a VNA having a significantly narrower bandwidth than the modulated signal bandwidth enables separation of the modulated and probe tone signals. VNA calibration further improves the measurement accuracy. For modulated signals with a significant power level in the frequency range of the probe tone signal, ensemble averaging of the composite probe tone and power tone signals is used to enable separation of the probe tone signal for measurement.
REFERENCES:
patent: 5191294 (1993-03-01), Grace et al.
patent: 5467011 (1995-11-01), Hunt
Cacciola, J., “Direct Vector Analyzer Measurements of Class B and C Amplifiers,” presented at Anritsu Technical Review Series, Jul. 1999.
Donecker, B., “Determining the Measurement Accuracy of the HP85 10 Microwave Network Analyzer,” RF & Microwave Measurement Symposium, Oct. 1984, pp. 4-70.
Feher, K., Telecommunications Measurements, Analysis, and Instrumentation, Prentice-Hall, month missing 1987, pp. 318-321.
Gard, K. G., Gutierrez, H. M., and Steer, M. B., “Characterization of Spectral Regrowth in Microwave Amplifiers Based on the Nonlinear Transformation of a Complex Gaussian Process,” IEEE Trans. On MTT, vol. 47, Jul. 1999, pp. 1059-1069.
Marks, R. B., “A Multiline Method of Network Analyzer Calibration,” IEEE Trans. On MTT, vol. 39, Jul. 1991, pp. 1205-1215.
Mazumder, S. R., and van der Puije, P.D., “Two-Signal Method of Measuring the Large Signal S-Parameters of Transistors,” IEEE Trans. On MTT, vol. 26, Jun. 1978, pp. 417-420.
Anritsu Company
Fliesler & Meyer LLP
Kerveros James C
Lamarre Guy J.
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