Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2005-05-31
2005-05-31
Tran, Minh-Loan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S072000, C257S350000, C257S412000, C257S413000, C349S046000
Reexamination Certificate
active
06900460
ABSTRACT:
The present invention provides the structure and manufacturing method of a semiconductor device that consumes small power even when a screen is made to be larger. A signal wiring line or a part of a gate wiring line is formed from a low resistant material (typically aluminum) and p-channel TFTs are used for a pixel TFT of a pixel portion. The p-channel TFT in the pixel portion has a multi-gate structure in which a plurality of channel formation regions are provided in order to reduce fluctuation in OFF current.
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JP 06-148685 English abstract.
JP 07-235680 English abstract.
JP 08-274336 English abstract.
JP 6-148685 full English translation.
JP 7-235680 full English translation.
JP 8-274336 full English translation.
Fujimoto Etsuko
Murakami Satoshi
Ono Koji
Suzawa Hideomi
Yamazaki Shunpei
Semiconductor Energy Laboratory Co,. Ltd.
Tran Minh-Loan
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