Method and apparatus for estimating semiconductor junction...

Communications: electrical – Condition responsive indicating system – Specific condition

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C340S522000, C340S653000, C324S765010, C324S762010, C324S762010, C324S762010, C324S762010, C361S093100, C361S093800, C361S100000, C361S103000, C361S106000

Reexamination Certificate

active

06888469

ABSTRACT:
An apparatus is disclosed that provides an estimate of the semiconductor junction temperature of a semiconductor device as a function of the electrical current flowing across the corresponding semiconductor junction. The apparatus includes a current sensor that samples and measures the current flowing across the semiconductor junction and provides an output signal indicative of the measured value to a current-to-temperature converter. The current-to-temperature converter estimates the temperature of the semiconductor junction using equations that include constants empirically derived for the particular device configuration including cooling and mounting methods used with it. The current-to-temperature converter provides an output temperature signal that is compared to a predetermined temperature threshold value, and in the event that the output temperature signal exceeds the predetermined temperature threshold value, an alarm signal is set.

REFERENCES:
patent: 3564293 (1971-02-01), Mungenast
patent: 3622849 (1971-11-01), Kelley et al.
patent: 4001649 (1977-01-01), Young
patent: 4052744 (1977-10-01), Boothman et al.
patent: 5249141 (1993-09-01), Vandebroek et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for estimating semiconductor junction... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for estimating semiconductor junction..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for estimating semiconductor junction... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3413041

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.