Method of testing an integrated circuit and an integrated...

Details Method of testing an integrated circuit and an integrated... Method of testing an integrated circuit and an integrated...

2005-05-31

2005-05-31

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06900656

ABSTRACT:
A method of testing an Integrated Circuit (IC) and an IC test apparatus is provided. In one embodiment, the method of testing includes (1) applying a voltage to the IC that is not a normal operating voltage of the IC and (2) temporarily biasing a well voltage of transistors in the IC allowing screening for the normal operating voltage.

REFERENCES:
patent: 6160414 (2000-12-01), Matsubara et al.
patent: 6515489 (2003-02-01), Min et al.

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