Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2005-05-10
2005-05-10
Walke, Amanda (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
C430S322000, C430S323000
Reexamination Certificate
active
06890689
ABSTRACT:
During the fabrication of a mask, to substantially avoid systematic deviations from a desired configuration of recesses that will be formed in the mask, the patterning of the mask substrate is carried out in a sequence of subprocesses. The subprocesses are matched to one another such that the deviations that are formed from these subprocesses compensate for one another, so that in this way, error correction is achieved.
REFERENCES:
patent: 6453274 (2002-09-01), Kamon
patent: 6492073 (2002-12-01), Lin et al.
patent: 6534242 (2003-03-01), Sugita et al.
patent: 6677088 (2004-01-01), Magome et al.
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Stemer Werner H.
Walke Amanda
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