Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2005-01-04
2005-01-04
Nguyen, Van Thu (Department: 2824)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S743000, C438S744000, C438S756000, C438S757000
Reexamination Certificate
active
06838391
ABSTRACT:
A method for the production of semiconductor components which includes applying masking layers and components on epitaxial semiconductor substrates within the epitaxy reactor without removal of the substrate from the reactor. At least one of the masking layers is HF soluble such that a gas etchant may be introduced within the reactor so as to etch a select number and portion of masking layers. This method may be used for production of lateral integrated components on a substrate wherein the components may be of the same or different type. Such types include electronic and optoelectronic components. Numerous masking layers may be applied, each defining particular windows intended to receive each of the various components. In the reactor, the masks may be selectively removed, then the components grown in the newly exposed windows.
REFERENCES:
patent: 4415404 (1983-11-01), Riegl
patent: 4614564 (1986-09-01), Sheldon et al.
patent: 4816098 (1989-03-01), Davis et al.
patent: 4980312 (1990-12-01), Harris et al.
patent: 5268069 (1993-12-01), Chapple-Sokol et al.
patent: 5418183 (1995-05-01), Joyner et al.
patent: 5668038 (1997-09-01), Huang et al.
patent: 5702569 (1997-12-01), Park et al.
patent: 5937273 (1999-08-01), Fujii et al.
patent: 6140247 (2000-10-01), Muraoka et al.
patent: 0681315 (2000-06-01), None
patent: 0746011 (2001-10-01), None
patent: 01270287 (1989-10-01), None
patent: 02-046407 (1990-02-01), None
patent: 5006880 (1993-01-01), None
patent: 5160085 (1993-06-01), None
patent: 6224153 (1994-05-01), None
patent: 07202317 (1995-08-01), None
B. Henle, et, al., “In Situ Selective Area Etching and Movpe Regrowth Of GainsAs-InP ON InP Substrates,”Int. Conf. On Indium Phosphide&Rel. Materials, U.S. NY; IEEE, Bd. CONF 4, S. pp. 159-162.
Sugano, Hikaru, “Semiconductor Laser Manufacturing Method”, Oct. 27, 1989, pp. 1-6.
JP-61 210687 Patent Abstracts of Japan, Venoffentlichung, Sep. 8, 1986.
G.B., Burns, “Lo-Temperature Native Oxide Removal From Silicon Using Nitrogen Trifluoride Prior To Low-Temperature Silicon Expitaxy”, Appl. Phys. Lett. 53 (15), Oct. 1988 pp 1423-1425.
T. Aoyama et al. “Silicon Surface Cleaning Using Photo excited Fluroing Gas Diluted With Hydrogen”, J. Electrochem. Soc. vol. 140, No. 6, Jun. 1993 pp 1704-1708.
K. Ozasa et al., “Deposition Of Thin Indium Oxide Film and Its Application To Selective Epitaxy For In Situ Procesing” Thin Solid Films, BD. 246, NR. 1/02, 1994, S. 58-64, XP000453839.
J.P. Harbinson et al., “Tungsten Patterning As A Technique For Selective Area III-V MBE Growth”, J. Vac. Sci. Technol. B3(2) Mar./Apr. 1995.
JP 02-046407, Patent Abstracts of Japan, Veroffentlicung: Feb. 2, 1990, Anmeldung: Aug. 5, 1988.
S. Yoshida et al., “Selective-Area Epitaxy Of GaAs Using A New Mask Material For In Situ Processes”, Inst. Phys. Conf. Ser. No. 129: Chapter 3, 1992, S-49-54, XP000366199.
P.J. O'Sullivan, et al., “Selective-Area Epitaxy For GaAs-on-InP Optoelectronic Integrated Circuits(OEICs)”, Semiconductor Sci. & Technol. 8, No. 6, Jun. 1993, pp 1179-1185.
Whidden T.K. et al.; “Catalyzed HF Vapor Ethcing Of Silicon Dioxide Fūr Micro-and Nanolithographic Masks”; Apr. 1995; J. Electrochem Soc., vol. 142, No. 4, pp 1199-1204.
Torek K. et al.; “Reduced Pressure Etching Of Thermal Oxides In Anhydrous HF/Alcoholic Gas Mixtures”; Apr. 1995; J. Electrochem Soc., vol. 142, No. 4, pp 1322-1326.
Wong M. et al., “Characterization Of Wafer Cleaning And Oxide And Oxide Etching Using Vapor-Phase Hydrgoen Fluoride”; Jun. 1991, J. Electrochem, Soc., vol. 138, No. 6, pp 1799-1802.
Nguyen Van Thu
Osram Opto Semiconductors GmbH & Co. oHG
Owens Beth E.
LandOfFree
Method of semiconductor processing including fluoride does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of semiconductor processing including fluoride, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of semiconductor processing including fluoride will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3407881