Pattern-profile measuring device

Geometrical instruments – Straightedge type – Rules

Reexamination Certificate

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Details

C033S645000, C033S562000, C033S566000

Reexamination Certificate

active

06944963

ABSTRACT:
This invention pertains to the art of methods and apparatuses associated with measuring and profile tools utilized in crafts, particularly in the design of quilts. More specifically, the invention provides an improved measuring tool that incorporates a variety of undulating profiles and is useful in the construction of quilts of other items of craftsmanship that incorporate non-linear, undulating, curving or wavy profiles.

REFERENCES:
patent: D163411 (1951-05-01), Picken
patent: 3071171 (1963-01-01), Guerrero
patent: 3673052 (1972-06-01), Small et al.
patent: 4022139 (1977-05-01), Carson
patent: 4053986 (1977-10-01), Axelrod
patent: 4386980 (1983-06-01), Fitzpatrick et al.
patent: 4502232 (1985-03-01), Broders
patent: 4642896 (1987-02-01), Grimm
patent: 4646666 (1987-03-01), Burrier
patent: 4912850 (1990-04-01), Gray
patent: 4945642 (1990-08-01), Saulietis
patent: 5230762 (1993-07-01), Horikiri
patent: 5319859 (1994-06-01), Smith
patent: 5557996 (1996-09-01), Reber et al.
patent: 5579670 (1996-12-01), McCormick
patent: 5638605 (1997-06-01), Sligar
patent: 5749149 (1998-05-01), Claytor
patent: 5791062 (1998-08-01), Walker
patent: 5813127 (1998-09-01), Blevins
patent: 5926966 (1999-07-01), Russell
patent: 5943974 (1999-08-01), Hoag
patent: 5966824 (1999-10-01), Vazquez
patent: 6112425 (2000-09-01), Nelson et al.
patent: 6321458 (2001-11-01), Hess
patent: 6357370 (2002-03-01), Fritz et al.
One page printout from Borderlines Rules—Used as early as May 2001.
One page printout from Borderlines Rules—Jan. 28, 2003.
One page printout from—Borderlines Patters 'n Letters Rulers—Apr. 27, 2004.

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