Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-07-05
2005-07-05
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S12100R
Reexamination Certificate
active
06915218
ABSTRACT:
An apparatus and method for constraining temporal parameters associated with the acquisition and display of signals under test acquires samples of a signal under test (SUT) as corresponding sample records with each sample record having associated with it a duration parameter. Display grids cooperate with the resulting waveform imagery by either being locked to the waveform image or locked to a display frame. A controller allows a user to select a number of volts for each vertical grid segment and an amount of time for each horizontal grid segment. The duration parameter determines the length in seconds of the acquired waveform as displayed, which parameter may be changed by adjusting the timebase parameters of record length or sample rate. Therefore when displayed the number of grid lines change as the waveform is expanded or contracted (locked to waveform), or the units between grid lines change as the waveform is expanded or contracted (locked to display frame).
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Gray Francis I.
Le Toan M.
Lenihan Thomas F.
Moser Patterson & Sheridan LLP
Tektronix Inc.
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