Projection exposure system for microlithography and method...

Photocopying – Projection printing and copying cameras – Illumination systems or details

Reexamination Certificate

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C355S053000

Reexamination Certificate

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06950174

ABSTRACT:
A method and an arrangement for microlithographic projection exposure at high aperture achieve a contrast increase by the polarization of the light perpendicular to the plane of incidence on the resist. Arrangements are provided which influence the tangential polarization or the linear polarization adapted to the dipole illumination in the illuminating system and in the reduction objective.

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Matsumoto et al. “Issues and mthod of designing lenses for optical lithography.” Optical Engineering, 31:12, pp. 2657-2664, Dec. 1992.
Unno, Yasuyuki. “Polarization effect of illumination light.” Optical/Laser Microlithography, VI, pp. 879-891, 1993.

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