Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
Reexamination Certificate
2005-09-06
2005-09-06
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Gate arrays
With particular signal path connections
C257S207000, C257S210000, C257S734000, C257S758000, C257S773000
Reexamination Certificate
active
06940108
ABSTRACT:
A slot design for a metal interconnect line comprising a metal interconnect including at least two metal sub-interconnect lines that intersect to form an intersection area. At least one of the metal sub-interconnect lines having elongated slots formed therein with the elongated slots each having an axis extending through the intersection area. The intersection area having an effective cross-sectional area that is at least equal to the effective cross-sectional area of at least one of the metal sub-interconnect lines having elongated slots formed therein.
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Cheng Tao
Wu Yun-Hung
Flynn Nathan J.
Mandala Jr. Victor A.
Taiwan Semiconductor Manufacturing Co. Ltd.
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