Optics: measuring and testing – By light interference
Reexamination Certificate
2005-09-27
2005-09-27
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Reexamination Certificate
active
06950191
ABSTRACT:
A circular region extracting method captures onto a coordinate system a fringe image of a sample having a circular region to be analyzed within an area to be observed, binary-codes the fringe image of the area by a fringe analysis method on the coordinate system, places a plurality of linear gratings in parallel with each other with a predetermined interval on thus binary-coded coordinate system, and uses the linear gratings so as to extract a circular image region representing the region to be analyzed on the coordinate system.
REFERENCES:
patent: 5523842 (1996-06-01), Yasuda et al.
patent: 6532073 (2003-03-01), Ge
patent: 6693715 (2004-02-01), Ge
patent: 6768554 (2004-07-01), Ge
patent: 6859566 (2005-02-01), Sun
Fujinon Corporation
Lyons Michael A.
Snider Ronald R.
Snider & Associates
Toatley , Jr. Gregory J.
LandOfFree
Method of extracting circular region from fringe image does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of extracting circular region from fringe image, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of extracting circular region from fringe image will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3391598