Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device
Reexamination Certificate
2005-01-18
2005-01-18
Zarabian, Amir (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
C257S302000, C257S201000
Reexamination Certificate
active
06844577
ABSTRACT:
Methods of forming thin film transistors, and transistors therefrom, are provided where at least one of the source or drain region is conductively doped while conductivity doping of the channel region is prevented without any masking by any separate masking layer. Methods include, providing a substrate having a conductive node; providing a first dielectric layer, a gate layer over the first layer and a second dielectric layer over the gate layer; providing a contact opening through the first and second layers and the gate layer, the opening defining projecting sidewalls; providing a gate dielectric layer within the opening; providing a layer of semiconductive material over the second layer, against the gate dielectric layer and in electrical communication with the node; the material defining a channel region; and conductively doping the semiconductive material layer lying outwardly of the contact opening to form one of a source region or a drain region.
REFERENCES:
patent: 4243997 (1981-01-01), Natori et al.
patent: 4467518 (1984-08-01), Bansal et al.
patent: 4845537 (1989-07-01), Nishimura et al.
patent: 4864374 (1989-09-01), Banerjee
patent: 5001540 (1991-03-01), Ishihara
patent: 5156987 (1992-10-01), Sandhu et al.
patent: 5208172 (1993-05-01), Fitch et al.
patent: 5214295 (1993-05-01), Manning
patent: 5229310 (1993-07-01), Sivan
patent: 5270968 (1993-12-01), Kim et al.
patent: 5274259 (1993-12-01), Grabowski et al.
patent: 5283455 (1994-02-01), Inoue et al.
patent: 5334862 (1994-08-01), Manning et al.
patent: 5397731 (1995-03-01), Takemura
patent: 5418393 (1995-05-01), Hayden
patent: 5432370 (1995-07-01), Kitamura et al.
patent: 5444275 (1995-08-01), Kugishima et al.
patent: 5463240 (1995-10-01), Watanabe
patent: 5508531 (1996-04-01), Ha
patent: 5561308 (1996-10-01), Kamata et al.
patent: 5599724 (1997-02-01), Yoshida
patent: 5612546 (1997-03-01), Choi et al.
patent: 5640034 (1997-06-01), Malhi
patent: 5700727 (1997-12-01), Manning
patent: 5747359 (1998-05-01), Yuan et al.
patent: 5925894 (1999-07-01), Yang
patent: 5930615 (1999-07-01), Manning
patent: 5994735 (1999-11-01), Maeda et al.
patent: 6074954 (2000-06-01), Lill et al.
patent: 6175134 (2001-01-01), Manning
“A New Toroidal TFT Structure for Future Generation SRAMs”: J.D. Hayden et al.; 1993 IEEE; pp. 33.5.1-33.5.4.
“Methods of Forming Small Contact Holes”: IBM Technical Disclosure Bulletin: Jan. 1988; vol. 30 No. 3: pp. 252-253.
Rose Kiesha L.
Wells St. John P.S.
Zarabian Amir
LandOfFree
Thin film transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Thin film transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin film transistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3390303