Method for removing photoresist

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S689000, C438S695000

Reexamination Certificate

active

06846748

ABSTRACT:
A method for removing photoresist is described. A substrate having a photoresist to be removed thereon is provided, and then an ashing process is performed to remove most of the photoresist. The substrate is irradiated with UV light, and the remaining photoresist and polymer are stripped with stripping solvents after UV irradiation.

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S.Wolf & R.N. Tauber, “Silicon Processing for the VLSI Era”, vol. 1, Lattice Press, 1995, pp. 439-442.

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