Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-01-11
2005-01-11
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S713000
Reexamination Certificate
active
06842019
ABSTRACT:
A method of testing reliability in an integrated circuit including an array of test circuits, each test circuit including a resistor. The method includes selecting a first test circuit from the array, measuring a pre-stress resistance value for the resistor in the selected test circuit, applying a high stress current across the resistor, removing the high stress current, and measuring a post-stress resistance value for the resistor. Other embodiments include measuring additional resistance values before applying and after removing the high stress current. One embodiment includes applying a positive voltage to one stress input terminal, and then testing a short sensing terminal for the positive voltage, both before and after applying the high stress current. These steps test for whether or not the high stress current has created a short in the test circuit.
REFERENCES:
patent: 6144214 (2000-11-01), Athan
patent: 6281696 (2001-08-01), Voogel
patent: 6313657 (2001-11-01), Hashimoto
patent: 6503765 (2003-01-01), Chao et al.
de Jong Jan L.
Ling Zicheng G.
Cartier Lois D.
Nguyen Vincent Q.
XILINX Inc.
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