Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to conductive state
Reexamination Certificate
2005-07-19
2005-07-19
Picardat, Kevin M. (Department: 2822)
Semiconductor device manufacturing: process
Making device array and selectively interconnecting
Using structure alterable to conductive state
C438S467000, C438S600000, C257S050000, C257S530000
Reexamination Certificate
active
06919234
ABSTRACT:
Method for producing an antifuse in a substrate, a first interconnect being applied to the substrate, a dielectric layer being applied at an end face of the first interconnect, which end face essentially runs vertically with respect to the substrate, a second interconnect being applied in such a way that it adjoins the dielectric layer with an end face, with the result that an antifuse structure is formed.
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German Examination Report dated Jun. 27, 2003.
Lindolf Jürgen
Schamberger Florian
Infineon - Technologies AG
Moser, Patterson & Sheridan L.L.P.
Picardat Kevin M.
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