Method and system for built in testing of switch...

Details Method and system for built in testing of switch... Method and system for built in testing of switch...

2005-09-27

2005-09-27

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06949935

ABSTRACT:
A system and method of testing switch functionality of a tunable capacitor array is disclosed. A built in test (BIT) circuit provides digital device for testing the functionality of a programmable switch capacitor array circuit. The method and system provides for switching a capacitor switch of a switch capacitor array between on and off, switching a test enable switch of a BIT circuit between on and off, pulling an internal node of the BIT circuit either high or low using a current source, and determining whether the internal node has been pulled either high or low. In addition, the method and system provides for making a pass or fail determination based on a determined state of the internal node.

REFERENCES:
patent: 5276446 (1994-01-01), Sellars
patent: 5581563 (1996-12-01), Penza et al.

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