Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration
Reexamination Certificate
2005-05-10
2005-05-10
Huynh, Andy (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified configuration
C257S736000, C257S750000, C257S752000, C257S758000, C257S773000, C257S786000
Reexamination Certificate
active
06891272
ABSTRACT:
A multilayered circuit component includes one or more substrates. A first surface of one of the substrates includes circuit paths and other current carrying elements. A second surface of the same or another substrate also includes circuit paths and other current carrying elements. An aperture extends through at least a portion of the one or more substrates. The aperture is defined by a first opening on the first surface, a second opening on the second surface, and an internal surface of the one or more substrates that extends between the first surface and the second surface. A first trace element is provided over a portion of the internal surface of the aperture to extend between the first surface and the second surface. The first trace element extends onto the first surface to form a first partial perimeter of the first opening. A second trace element is provided over a portion of the internal surface of the aperture to extend between the first surface and the second surface. The second trace element extends onto the first surface to form a second partial perimeter of the first opening.
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PCT International Search Report, dated Nov. 3, 2003, 8 pages.
Fjelstad Joseph C.
Haba Belgacem
Huynh Andy
Shemwell Gregory & Courtney LLP
Silicon Pipe, Inc.
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