Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-04-19
2005-04-19
Assouad, Patrick (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S620000, C324S627000, C324S624000, C324S076210
Reexamination Certificate
active
06882947
ABSTRACT:
A technique for measuring spectral components, such as noise and distortion, of a non-coherently sampled test signal containing at least one tone of known frequency includes modeling the spectral components of the at least one tone, including the effects of leakage, based upon frequency of the at least one tone and a plurality of known sampling parameters. A DFT is taken of the sampled test signal, and the DFT is adjusted based on the modeled spectral components. The adjusted DFT is substantially leakage-free and directly reveals spectral components of the test signal, including low-power components that would ordinarily be lost in the leakage errors.
REFERENCES:
patent: 4319329 (1982-03-01), Girgis et al.
patent: 4686457 (1987-08-01), Banno
patent: 5610847 (1997-03-01), Kundert
patent: 5809133 (1998-09-01), Bartkowiak et al.
patent: 6046977 (2000-04-01), Bartkowiak
patent: 6240129 (2001-05-01), Reusens et al.
patent: 6298363 (2001-10-01), Iannuzzelli
patent: 6587559 (2003-07-01), Bartkowiak
patent: 6687630 (2004-02-01), Dionne
patent: 0297418 (1988-06-01), None
Xi et al., “A New Algorithm for Improving the Accuracy of Periodic Signal Analysis”, IEEE, 1996.*
Minett et al., “A Fuzzy Discrete Fourier Transform for Reduction of Spectral Leakage”, IEEE, 1997.*
U.S. Appl. No. 09/896,788, filed Jun. 29, 2001, Dionne.
Refining the digital spectramDavid, P.A.M.-S.; Szczupak, J., Circuits and Systems, 1996., IEEE 39th Midwest symposium on , vol.: 2 , 1996, Page(s): 767-770 vol. 2.
Quasi-synchronous sampling algorithm and its applicationsXianzhong Dai; Gretsch, R., Instrumentation and Measurement, IEEE Transactions on , vol.: 43 Issue: 2 , Apr. 1994, Page(s): 204-209.
Assouad Patrick
Teradyne Legal Department
Teradyne, Inc.
LandOfFree
Discrete fourier transform (DFT) leakage removal does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Discrete fourier transform (DFT) leakage removal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Discrete fourier transform (DFT) leakage removal will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3372348