Probe pin assembly

Details Probe pin assembly Probe pin assembly

2005-01-25

2005-01-25

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S761010

Reexamination Certificate

active

06847221

ABSTRACT:
A prove pin assembly is provided in which the probe pins for a chip under test occupy the only space above the chip, not extending into the space above the adjacent chip. The probe pin assembly has a lateral array of parallel probe pins of a plurality of first perpendicular-type probe pins and a vertical array of parallel probe pins of a plurality of second perpendicular-type probe pins, wherein said lateral array of parallel probe pins and vertical array of parallel probe pins occupy different spaces for deformation above the region of the chip under test and fit in the limited planar range corresponding to the chip.

REFERENCES:
patent: 4898539 (1990-02-01), Glover et al.
patent: 5545045 (1996-08-01), Wakamatsu
patent: 5864946 (1999-02-01), Eldridge et al.
patent: 5923178 (1999-07-01), Higgins et al.
patent: 5952843 (1999-09-01), Vinh
patent: 5955888 (1999-09-01), Frederickson et al.
patent: 6150830 (2000-11-01), Schmid et al.
patent: 6426638 (2002-07-01), Di Stefano

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