Image analysis – Applications – Document or print quality inspection
Reexamination Certificate
2000-12-29
2004-11-09
Mehta, Bhavesh M. (Department: 2625)
Image analysis
Applications
Document or print quality inspection
C250S559020, C355S106000, C396S575000, C382S168000, C382S274000
Reexamination Certificate
active
06816604
ABSTRACT:
TECHNICAL FIELD OF THE INVENTION
This invention relates generally to image processing and more particularly to a digital film processing feature location method and system.
BACKGROUND OF THE INVENTION
The process of producing images from film typically includes obtaining data from the film and producing image data in a variety of forms. For example, the process may produce photographic prints, slides, and/or digital representations thereof. Usually the process of scanning data from film results in surplus data with no image content, such as data obtained from unexposed regions of the film. This surplus data is outside of the extents (that is, one or more outermost regions of the image data) of the images on the film. Separation of the image data from this surplus data is typically a complex and time-consuming process. Cropping techniques may be employed to improve the appearance of the images by separating the image data from the surplus data obtained from the film. However, these techniques may not provide the flexibility to be used with a variety of digital film processing systems. For example, where the film is developing, characteristics of the film and/or any developing chemical applied thereto vary as the film develops, and may affect the accuracy of these cropping techniques.
In addition, processing images from film typically includes capturing digital data from the film with a sensor as the film is illuminated with a light source. Because the illumination levels captured by the sensor represent the image data, any sensor or illumination non-uniformities introduce undesirable errors into the data measurements. Unfortunately, sensor and illumination characteristics typically vary individually and can drift over time due to factors such as heating and/or transient responses in the devices when they are activated and deactivated. Obtaining digital image data from developing film presents additional challenges. Where the film is scanned while being developed, variances in film and chemical developer characteristics often arise due to changes that take place during the development process. These variations often affect the quality of the resultant image.
SUMMARY OF THE INVENTION
From the foregoing, it may be appreciated that a need has arisen for providing a time invariant feature location method and system. In accordance with the present invention, a system and method are provided that substantially reduce or eliminate disadvantages and problems of conventional systems.
One aspect of the invention is a method for locating an unexposed region of film. The method includes the step of illuminating film with a light source while the film has developing chemical applied thereto, the film comprising at least two edges along an x direction perpendicular to a y direction parallel to a surface of the film. The method also includes the step of identifying an unexposed region of the film as a region containing ones of a first plurality of columns of the film, the columns disposed generally in the y direction and captured using at least one sensor operable to capture light reflected from the film, and wherein a representative value for each of the ones of first plurality of columns exceeds a threshold. In a further embodiment, the method includes the step of determining a plurality of rates of change calculated between a plurality of pairs, each pair comprising at least two adjacent values from the least a portion of a row of values captured from the film, the row of values oriented generally in the x direction perpendicular to the y direction across the film and comprising at least the ones of the first plurality of columns. The method includes the step of comparing the rates of change to an expected signature of an unexposed region and adjusting the location of the unexposed region in response to the comparison.
The invention provides several important advantages. Various embodiments of the invention may have none, some, or all of these advantages. For example, the invention may effectively create, identify and/or locate various features in film while the film is developing. These features may be used as reference data that may be used to adjust image data, thereby improving the quality of resultant images derived therefrom. For example, the invention may locate image extents and unexposed regions of film while the film is developing and thus facilitate the removal of surplus data outside these extents. In some applications, such an advantage may reduce the storage space used to capture data from a roll of film and may further reduce computing resources used to manipulate the captured image data.
Location of one or more unexposed regions of film may provide a window of opportunity to measure data that may be used to correct and/or adjust captured image data. For example, the invention may capture measurements such as white levels that may be used to normalize and/or equalize captured image data, thus improving the accuracy thereof.
The invention may provide the flexibility to be used with a variety of digital film processing systems and a variety of film types. For example, the invention may be used with data that was obtained from film while the film was developing. The invention may also be used with scanners, and/or systems that capture digital data from the film with a sensor as the film is illuminated with a light source. The invention may also be used with systems that capture data for an entire roll of film or a portion thereof, including unexposed regions of the film that typically include no image data. Other technical advantages may be readily ascertainable by those skilled in the art from the following figures, description, and claims.
REFERENCES:
patent: 3785268 (1974-01-01), Gregg et al.
patent: 5266805 (1993-11-01), Edgar
patent: 5319719 (1994-06-01), Nakazawa et al.
patent: 5528288 (1996-06-01), Sandor et al.
patent: 5991010 (1999-11-01), Nishio
patent: 6091445 (2000-07-01), Matsui et al.
patent: 6442301 (2002-08-01), Edgar
Ball Richard D.
Cannata Philip E.
Digby Marc C.
Jones David N.
Young, Jr. Robert S.
Azarian Seyed
Baker & Botts
Eastman Kodak Company
Mehta Bhavesh M.
Novais David A.
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