Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2001-01-26
2004-06-15
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S119000, C714S027000, C714S036000, C714S799000, C717S106000, C717S149000, C713S001000, C713S002000
Reexamination Certificate
active
06751569
ABSTRACT:
BACKGROUND
The disclosures herein relate generally to computer systems and more particularly to a system and method for receiving information from a test apparatus.
In the process of manufacturing a computer system, certain information may be provided to the computer system. This information may include a serial number or network address, for example. The process of providing information to a computer system typically adds to the amount of time needed to manufacture the computer system.
In addition, a computer system needs to be tested during the manufacturing process to ensure its reliability. Tests performed on a computer system may include functional tests to ensure the function of a computer system and electrical tests to ensure the proper connection of components of the computer system. Like the process of programming information onto a computer system, the process of testing a computer system typically adds to the amount of time needed to manufacture the computer system.
It would be desirable for a test apparatus to be able to communicate with a computer system during the manufacturing process to allow information to be transferred between the test apparatus and the computer system. Therefore, what is needed is a system and method for receiving information from a test apparatus.
SUMMARY
One embodiment, accordingly, provides a system that includes a computer system configured to boot using a system firmware. The system firmware includes instructions for causing the computer system to provide a control code to a test apparatus configured to perform a functional test on the computer system and receive information provided by the test apparatus in response to the control code.
A principal advantage of this embodiment is that it allows a test apparatus to provide information to a computer system during the manufacturing process. As a result, the amount of time needed to manufacture a computer system may be reduced and the manufacturing process may be further automated.
REFERENCES:
patent: 5388267 (1995-02-01), Chan et al.
patent: 5423029 (1995-06-01), Schieve
patent: 5535330 (1996-07-01), Bell
patent: 5823818 (1998-10-01), Bell et al.
patent: 5854937 (1998-12-01), Woodward
patent: 5875293 (1999-02-01), Bell et al.
Microsoft Press Computer Dictionary, 3rdEdition, 1997, pp. 225-226.
Alexander Marc D.
Merkin Cynthia M.
Barlow John
Dell Products L.P.
Haynes and Boone LLP
Vo Hien
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