Semiconductor package for high frequency performance

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame

Reexamination Certificate

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Details

C257S670000, C257S671000, C257S676000, C257S684000, C257S692000, C257S693000, C257S696000, C257S698000, C257S717000

Reexamination Certificate

active

06831352

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates generally to integrated circuit assembly, and more specifically to a method and apparatus for packaging a semiconductor device in order to achieve optimal high frequency performance of the device.
2. Description of the Prior Art
Integrated circuit assembly includes semiconductor packaging wherein a semiconductor device, referred to as a die or chip, is placed in a sealed environment to protect the device from exposure to outside elements. In accordance with typical semiconductor packaging methods, a die is attached to a paddle, or die flag, of a metal lead frame, and encapsulated in a plastic package. Typical packaging methods include forming an assembly by mounting a die to a lead frame using an epoxy, connecting bond pads of the die to the lead frame using gold or aluminum wires, and sealing the entire assembly using lids or thermoplastic setting compounds.
FIG. 1A
shows a top plan view of a conventional semiconductor package at
10
, the package
10
including a package body
12
having a lead frame (not shown), the lead frame having a paddle area indicated by a dashed line
14
. The package body
12
is encapsulated in plastic, and of leads
16
of the lead frame extend outward from opposite sides of the package.
FIG. 1B
shows a side elevation view at
20
of the semiconductor package
10
. Each of the leads
16
includes a lead foot
22
which provides for mounting the semiconductor package onto a board (not shown). As shown in
FIG. 1B
, the leads
16
may extend downward to a point even with a bottom surface
24
of the package.
FIG. 1C
shows an alternative configuration of a typical semiconductor package at
30
wherein a plurality of leads
32
of a lead frame extend downward beyond the bottom surface
24
of the package.
Semiconductor devices are usually packaged in accordance with a packaging technique that is suited to achieve specific performance requirements of the particular device. Many types of semiconductor devices have specific requirements for electrical grounding, heat dissipation, and power dissipation. For high frequency semiconductor devices, electrical grounding is an important design consideration because of the effect of electrical impedance, and particularly inductive impedance, on high frequency performance.
In one type of semiconductor device package, a bottom portion of the paddle of the lead frame is exposed, and forms a lower surface of the semiconductor package. The exposed portion of the paddle structure provides for enhanced heat dissipation. When affixed to a contact area of a circuit board, the exposed portion of the paddle provides electrical grounding for the semiconductor package. Selected bond pads of the die may be connected to the grounded paddle via ground wires. In a conventional semiconductor package, the ground wires traverse relatively large distances.
FIG. 2A
shows a cross sectional side view of a conventional semiconductor package device at
36
, the device including a die
38
attached to a flat paddle
40
formed by a planar member of a lead frame. The lead frame and die are encapsulated in plastic
44
. A bottom portion
45
of the paddle
40
is exposed, and forms a lower surface of the semiconductor package
36
. The exposed portion
45
of the paddle provides for enhanced heat dissipation. When affixed to a contact area of a circuit board, the exposed portion
45
of the paddle
40
provides electrical grounding of the paddle. Selected bond pads (not shown) of the die
38
are attached to the paddle
40
by ground wires
42
. Because of the planar shape of the paddle
40
, the ground wires
42
must extend a relatively long distance to connect the bond pads at the top surface of the die
38
to the surface of the paddle
40
. The impedance of the relatively long ground wires
42
causes inductance effects at high frequencies which may result in excessive ringing and noise in the performance of the device. What is needed is a method and apparatus for packaging high frequency semiconductor devices wherein the lengths of grounding wires are minimized in order to minimize excessive inductance effects which could compromise the performance of the device.
Thermal dissipation is another important design consideration in packaging techniques for many different types of devices. Therefore, what is also needed is a method and apparatus for packaging high frequency semiconductor devices wherein thermal dissipation is optimized.
SUMMARY OF THE INVENTION
It is an object of the present invention to provide a method and apparatus for packaging high frequency semiconductor devices wherein the lengths of grounding wires are minimized in order to minimize excessive inductance effects which could compromise the performance of the device.
It is also an object of the present invention to provide a method and apparatus for packaging high frequency semiconductor devices wherein thermal dissipation is optimized.
Briefly, a presently preferred embodiment of the present invention provides an improved lead frame structure for use in a semiconductor package. The lead frame structure includes: a plurality of leads; a paddle structure electrically isolated from the leads, the paddle structure including at least one lower paddle section having a first top surface to which a die may be attached, at least one mesa section disposed proximate the paddle section and having a second top surface disposed at a different elevation than the first top surface, the lower paddle section and the mesa section being joined by a wall section; and a plurality of tie bars attached to the paddle structure for supporting the paddle structure; whereby contact pads of a die attached to the first top surface may be electrically connected to the second top surface and to the leads prior to encapsulation thereof. A plurality of tie bars extends from opposite edges of the paddle structure, the tie bars providing for stabilizing the paddle structure during package fabrication.
In one embodiment, the paddle section of the paddle structure is formed by a planar member having a substantially rectangular shape, wherein the mesa section surrounds the lower paddle section.
In another embodiment, the second top surface comprises a continuous surface that surrounds the first top surface. The paddle structure is formed by coining a generally rectangular lead frame portion having a plurality of relief holes disposed proximate corners thereof.
In a further embodiment, the paddle structure comprises a plurality of mesa sections disposed at opposite sides of the lower paddle section. At least one of the leads may include: a lead stitch post disposed at a distal end of the lead and providing a surface for wire bonding; an upper lead section disposed at a different elevation than the lead stitch post; and a medial riser section joining the lead stitch post and the upper lead section.
An important advantage of the semiconductor device package of the present invention is that the mesa section of the paddle structure enables the use of shorter grounding wires which allow for reduced inductive impedance. This reduction in inductive impedance enables enhanced high frequency performance of the device by minimizing excessive inductance effects which would compromise the performance of the device.
The foregoing and other objects, features, and advantages of the present invention will be apparent from the following detailed description of the preferred embodiment which makes reference to the several figures of the drawing.


REFERENCES:
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patent: 4855807 (1989-08-01), Yamaji et al.
patent: 5442234 (1995-08-01), Liang
patent: 5471088 (1995-11-01), Song
patent: 5497033 (1996-03-01), Fillion et al.
patent: 5606199 (1997-02-01), Yoshigai
patent: 5633528 (1997-05-01), Abbott et al.
patent: 5767528 (1998-06-01), Sumi et al.
patent: 5869883 (1999-02-01), Mehringer et al.
patent: 6054753 (2000-04-01), Inaba
patent: 6198163 (2001-03-01), Crawley et al.
patent: 6246110 (2001-06-01

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