Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only
Reexamination Certificate
2000-12-15
2004-08-03
Ton, Toan (Department: 2871)
Liquid crystal cells, elements and systems
Particular structure
Having significant detail of cell structure only
C349S152000, C349S043000, C349S140000
Reexamination Certificate
active
06771346
ABSTRACT:
FIELD OF THE INVENTION
The present invention relates to a liquid crystal display which drives the liquid crystal by using an active matrix substrate on which a thin-film transistor (hereinafter, referred to TFT (Thin Film Transistor) is formed, and also concerns a manufacturing method for such a liquid crystal display.
BACKGROUND OF THE INVENTION
As illustrated in 
FIG. 14
, in a conventional liquid crystal display using a TFT as a switching element, on a glass substrate 
101
 are placed a gate electrode 
102
 formed through the same process, gate wiring (not shown) connected to the gate electrode 
102
 and a source signal input terminal 
103
.
Moreover, a gate insulation film 
105
 is formed on the entire surface of the glass substrate 
101
, except for a terminal section contact hole 
104
 formed on the source signal input terminal 
103
. On the gate electrode 
102
 are placed, through a gate insulation film 
105
, an amorphous silicon semiconductor layer (hereinafter, referred to as a-Si layer) 
106
 and an amorphous silicon semiconductor layer (hereinafter referred to as n
+ 
a-Si layer) 
107
. The n
+ 
a-Si layer 
107
, which is an amorphous silicon semiconductor layer to which an impurity is added, is an ohmic contact layer that is provided so as to ohmic-connect the a-Si layer 
106
 to a source electrode and a drain electrode, which will be described later.
A source electrode 
108
 and a drain electrode 
109
 are placed on the a-Si layer 
106
 and n
+
 a-Si layer 
107
, and a source wire 
110
 is formed integrally with the source electrode 
108
 through the same process.
A TFT 
111
 is constituted by the gate electrode 
102
, a-Si layer 
106
, n
+
 a-Si layer 
107
, source electrode 
108
, and drain electrode 
109
, etc., arranged as described above.
Moreover, a protective film 
113
 and a resin layer 
114
, which are used for protecting one portion of the source wire 
110
 and the TFT 
111
, are formed except for the terminal section contact hole 
104
 and a display section contact hole 
112
 formed on the drain electrode 
109
.
Moreover, the connection electrode 
115
 is joined to the source signal input terminal 
103
 so that the source wire 
110
 and the source signal input terminal 
103
 are connected to each other through the terminal contact hole 
104
. Moreover, the display electrode layer 
116
 and the drain electrode 
109
 are connected through the display contact hole 
112
.
The above-mentioned conventional liquid crystal display is manufactured through the following processes (1) to (8):
(1) First, a metal thin film, composed of titanium (Ti), aluminum (Al), or chromium (Cr), etc., is formed on a washed glass substrate 
101
 by sputtering, etc. Then, a photolithographic technique, which carries out etching by using a mask that is formed by applying photoresist to the metal thin film and exposing and developing it, is used to simultaneously form the gate electrode 
102
, the gate wire connected to the gate electrode 
102
 and the source signal input terminal 
103
.
(2) SiN
x
, which forms a gate insulation film 
105
, is formed thereon by using a mixed gas of SiH
4
/NH
3
/N
2 
through a P-CVD method.
(3) an a-Si film is formed on the gate insulation film 
105
 by using SiH
4
/H
2
.gas through a P-CVD method. In the same manner, an n
+
a-Si film is formed by using SiH
4
/H
2
.gas with mixed PH
3 
through a P-CVD method. Thereafter, the a-Si layer 
106
 and the n
+
a-Si layer 
107
 are patterned through a photolithography technique, etc.
(4) Moreover, a multi-layer structure metal thin-film, such as an Al/Ti thin-film, is formed, and this metal thin film is patterned through a photolithography technique, etc.
so that a source electrode 
108
, a drain electrode 
109
 and a source wire 
110
 are formed.
(5) Next, SiN
x 
is deposited by a P-CVD method using a mixed gas of SiH
4
/NH
3
/N
2 
to form a protective film 
113
.
(6) On the protective film 
113
, a resin layer 
114
, which serves as a second protective film, is patterned and formed through a photolithography method, etc., and is subjected to a heating process, etc. to cure the resin. In this state, terminal section contact holes 
104
 and display section contact holes 
112
 are formed in the resin layer 
114
.
(7) Next, in the terminal section contact hole 
104
, the gate insulation film 
105
 and the protective film 
113
 are simultaneously etched and removed by using the source wire 
110
 and the resin layer 
114
 as masks. Here, with respect to the display section contact hole 
112
 formed in the process (6), since the drain electrode 
109
 serves as an etching stopper, the gate insulation film 
105
 beneath it is allowed to remain.
(8) The connection electrode 
115
 and the display electrode 
116
 are formed.
Moreover, as illustrated in 
FIG. 15
 (
a
) and FIG. 
15
(
b
), in another liquid crystal display, on an insulation substrate 
201
 made of glass, etc., a gate wire 
202
 on which a gate signal input terminal 
202
a 
and a gate electrode 
202
b 
are integrally formed, a support capacity wire 
204
, a support capacity electrode 
204
b 
and support capacity signal input terminal 
204
a 
connected to the support capacity wire 
204
 are formed.
Then, on top of these layers, through a gate insulation film 
207
, are formed an a-Si layer 
208
a 
made of an amorphous silicon semiconductor layer, and an n
+
a-Si layer 
208
b 
that is an amorphous silicon semiconductor layer to which impurities such as phosphor (P) are added so as to realize ohmic connections between the a-Si layer 
208
a 
and a source electrode 
209
b 
as well as a drain electrode 
210
.
Next, after a multi-layer structure film, such as an Al/Ti film, not shown, has been deposited on the a-Si layer 
208
a 
and n
+
a-Si layer 
208
b 
that are the semiconductors, a source electrode 
209
b
, a drain electrode 
210
 and a source wire 
209
 that serves as bus wiring for them are formed. Moreover, a TFT 
211
 is formed by the source wire 
209
, a source electrode 
209
b 
and a source signal input terminal 
209
c 
that are integral with the source wire 
209
 and a drain electrode 
210
.
Next, an overcoat layer 
212
, made of an insulation film such as SIN, for protecting the source wire 
209
 and TET 
211
, and a resin insulation film 
213
 made of an insulation photosensitive acrylic resin, etc. are successively laminated so that an overcoat layer having a two-layer structure is formed.
Next, the resin insulation film 
213
, made of a photosensitive acrylic resin, etc., is exposed in an exposing process by using a predetermined mask, and then subjected to a developing process so that a contact hole 
215
 is formed in the resin insulation film 
213
. Simultaneously with this process, the resin insulation film 
213
 over the source signal input terminal 
209
c
, the gate signal input terminal 
202
a 
and support capacitor signal input terminal 
204
a 
is removed therefrom.
By using the resin insulation film 
213
 thus patterned as a mask for an etching process, the overcoat layer 
212
 located at the bottom of the contact hole 
215
, and the overcoat layer 
212
 covering the source signal input terminal 
209
c
, the gate signal input terminal 
202
a 
and the supplementary capacitance signal input terminal 
204
a 
are simultaneously removed.
Successively, by using the resin insulation film 
213
 patterned as described above as a mask for an etching process, the gate insulation film 
207
 covering the gate signal input terminal 
202
a 
and the supplementary capacitance signal input terminal 
204
a 
is removed therefrom.
Next, a pixel display electrode 
214
, which is used for applying a voltage to liquid crystal formed over the surface of the resin insulation film 
213
 including the inside of the contact hole 
215
 formed in the resin insulation film 
213
, is formed so that the drain electrode 
210
 on the base section of the contact hole 
215
 is electrically connected.
However, the above-mentioned manufacturing method for the conventional liquid crystal display has raised the following problems.
In the 
Imai Hajime
Sugimoto Osamu
Conlin David G.
Duong Thoi V.
Edwards & Angell LLP
Konieczny J. Mark
Sharp Kabushiki Kaisha
LandOfFree
Liquid crystal display and manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Liquid crystal display and manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Liquid crystal display and manufacturing method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3308530