Dual-lens shearing interferometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356 355, 356359, G01B 902

Patent

active

050043455

ABSTRACT:
This invention includes a method and apparatus for nondestructive testing of objects. The invention concerns a method of practicing shearography, i.e. forming two laterally-displaced images of the test object and causing these images to interfere. The invention includes the steps of directing a beam of coherent light onto the object and directing the reflected light onto a detector, such as a photographic film. A pair of lenses, laterally-displaced from each other, are placed between the object and the detector. Both lenses produce an image of the object at the plane of the detector, and because the lenses are spaced apart, the images produced are also spaced apart. In other words, the dual lens system causes two images from two different regions on the surface of the object to meet at the image plane. These images interfere with each other to form a speckle pattern. When the object is deformed, the speckle pattern changes. Comparison of the speckle patterns with and without deformation yields information on the relative deformation of the two regions of the object. The method can be used to evaluate nondestructively the integrity of the object.

REFERENCES:
patent: 3218916 (1965-11-01), Saunders
patent: 3487227 (1969-12-01), Kinzly
patent: 3532431 (1970-10-01), Bryngdahl
patent: 3626753 (1971-12-01), Aprahamian
patent: 3767308 (1973-10-01), Duffy
patent: 3816649 (1974-06-01), Butters
patent: 3829219 (1974-08-01), Wyant
patent: 3849003 (1974-11-01), Velzel
patent: 3870414 (1975-03-01), Duffy
patent: 3911729 (1975-10-01), Collins
patent: 3943278 (1976-03-01), Ramsey
patent: 4118124 (1978-10-01), Matsuda
patent: 4139302 (1979-02-01), Hung
patent: 4523469 (1985-06-01), Scott
patent: 4541280 (1985-09-01), Cielo
patent: 4633715 (1987-01-01), Monchalin
patent: 4650302 (1987-03-01), Grant
patent: 4690552 (1987-09-01), Grant
"Shearography Versus Holography in Nondestructive Testing" by Y. Y. Hung, 1986, vol. 604 Proceedings of The International Society for Optical Engineering.
Y. Y. Hung, "Shearography: A New Optical Method for Strain Measurement and Nondestructive Testing"; Optical Engineering, May/Jun. 1982, vol. 21 No. 3, pp. 391-395.
Y. Y. Hung et al., "Measurement of Slopes of Structural Deflections by Speckle-Shearing Interferometry", Experimental Mechanics, vol. 14 No. 7, Jul. 1974, pp. 281-285.
Y. Y. Hung et al., "Speckle-Shearing Interferometric Technique: a Full-Field Strain Gauge", Applied Optics, vol. 14 No. 3, Mar. 1975, pp. 618-622.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Dual-lens shearing interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dual-lens shearing interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual-lens shearing interferometer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-324547

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.